Automating Analog Test Design
نویسنده
چکیده
A method of performing analog/mixed signal test will be described based on the assumption that: 1. All failure modes do not have to be defined. 2. The majority of failures are described by catastrophic faults [1-3]. Working forward from these assumptions, a comprehensive method will be presented that results in identifying a test suite that can serve either as a product acceptance test or a field test for fault isolation and repair. The resulting test suites are characterized by their percent fault coverage and number of replaceable components required for repair. The role of tolerance faults, correlated process faults and traditional IC defects are folded into the test methodology.
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